TFT-LCD Mura Defects Using Independent Component Analysis
نویسندگان
چکیده
منابع مشابه
Automatic Detection of Region-Mura Defect in TFT-LCD
Visual defects, called mura in the field, sometimes occur during the manufacturing of the flat panel liquid crystal displays. In this paper we propose an automatic inspection method that reliably detects and quantifies TFT-LCD regionmura defects. The method consists of two phases. In the first phase we segment candidate region-muras from TFT-LCD panel images using the modified regression diagno...
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In recent days, large-sized flat-panel display (FPD) has been increasingly applied to computer monitors and TVs. Mura defects, appearing as low contrast or non-uniform brightness region, sometimes occur in manufacturing of the Thin-Film Transistor Liquid-Crystal Displays (TFT-LCD). Implementation of automatic Mura inspection methods is necessary for TFT-LCD production. Various existing Mura det...
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Large-sized Flat-Panel Displays (FPDs) have become increasingly important for use in PC monitors and TVs. To improve the yield of Liquid Crystal Display (LCD) panels, process control becomes a critical task in LCD manufacturing. In this paper we propose a control chart based on Independent Component Analysis (ICA) to monitor TFT-LCD process variations. The proposed method can be effectively use...
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Recently, mura defect inspection techniques are receiving attention in LCD production procedure since demands of TFT-LCD are growing. In this paper, we propose an automatic mura defect inspection method using gabor wavelet transform and DCT. First, we generate a reference panel image using DCT based method. For original panel image and generated reference panel image, we apply a gabor wavelet t...
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In recent days, large-sized flat-panel display (FPD) has been increasingly applied to computer monitors and TVs. Mura defects, appearing as low contrast or non-uniform brightness region, sometimes occur in manufacturing of the Thin-Film Transistor Liquid-Crystal Displays (TFT-LCD). Implementation of automatic Mura inspection methods is necessary for TFT-LCD production. Various existing Mura det...
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ژورنال
عنوان ژورنال: Journal of Advanced Mechanical Design, Systems, and Manufacturing
سال: 2009
ISSN: 1881-3054
DOI: 10.1299/jamdsm.3.115